At 2 hours for perhaps 5 or 6 circuits, you can't hope to test all of them anywhere near properly, and will have to skip a lot of the tests.
For example, a socket RFC, you won't have time to cross connect L-E and measure R1+R2 at each outlet - probably Zs measurements and IR tests are all you can do. And you maybe won't even have time to start disconnecting cables at the CU to measure IR for individual circuits, it will be a global measurement.
So then either you have a lot of LIMs on the test sheet (I've seen this) or instead you start making the numbers up (I've seen this too).
But what if you just measure Zs at the sockets and the results suggest a broken ring? Or the global IR tests are low and you need to find out which circuit is causing this? And there is no time to test fully.