- Reaction score
- 8,896
It also seems illogical that a device that can routinely handle many amps would actually care about 150mA going somewhere else and I agree that this can't really make a material difference to device life.
Surely the only metric that is relevant is the total number of operations.
I did however watch a video suggesting that the 1x and 5x at 0 and 180 degrees were basically manufacturing design standards and these got adopted for routine in-service testing without much consideration.
At the end of the day the device will trip at a certain threshold or not, and the required time for this incorporates several waves at 50Hz so maybe it is fair to say that testing at both 0 and 180 degrees has always been a bit over-zealous.
It's certainly quicker to go along a row at x1/2 and check they don't trip, and go along at x1 and check they do, and then check the test buttons, and the lesser disruption during commercial EICRs can be helpful!
Surely the only metric that is relevant is the total number of operations.
I did however watch a video suggesting that the 1x and 5x at 0 and 180 degrees were basically manufacturing design standards and these got adopted for routine in-service testing without much consideration.
At the end of the day the device will trip at a certain threshold or not, and the required time for this incorporates several waves at 50Hz so maybe it is fair to say that testing at both 0 and 180 degrees has always been a bit over-zealous.
It's certainly quicker to go along a row at x1/2 and check they don't trip, and go along at x1 and check they do, and then check the test buttons, and the lesser disruption during commercial EICRs can be helpful!